Tetrahydrothiophene
Molecular formula: |
C4H8S |
Molar mass: |
88.17 g·mol-1 |
CAS registry number: |
110-01-0 |
P. Haimi, P. Uusi-Kyyny, J. -P. Pokki and V. Alopaeus
Infinite dilution activity coefficient and vapour liquid equilibrium measurements for dimethylsulphide and tetrahydrothiophene with hydrocarbons
Fluid Phase Equilib.
• Year: 2010
• Volume: 295
• Pages: 17-25.
Keywords:
Infinite dilution activity coefficient, Sulphur compounds, VLE
DOI: 10.1016/j.fluid.2010.03.027
ThermoML:
http://trc.nist.gov/ThermoML/fpe/j.fluid.2010.03.027.xml
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E. Sapei, P. Uusi-Kyyny, K. I. Keskinen, J. -P. Pokki and V. Alopaeus
Vapor liquid equilibrium for binary system of tetrahydrothiophene + 2,2,4-trimethylpentane and tetrahydrothiophene + 2,4,4-trimethyl-1-pentene at 358.15 and 368.15 K
Fluid Phase Equilib.
• Year: 2010
• Volume: 296
• Pages: 159-163.
Keywords:
Vapor pressure, Vapor-liquid equilibria, Tetrahydrothiophene, 2,2,4-Trimethylpentane, 2,4,4-Trimethyl-1-pentene, COSMO-SAC
DOI: 10.1016/j.fluid.2010.03.022
ThermoML:
http://trc.nist.gov/ThermoML/fpe/j.fluid.2010.03.022.xml
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A. Sundberg, P. Uusi-Kyyny, M. Pakkanen, J. -P. Pokki and V. Alopaeus
Vapor-Liquid Equilibrium for Tetrahydrothiophene + n-Butane, + trans-2-Butene, + 2-Methylpropane, and + 2-Methylpropene
J. Chem. Eng. Data
• Year: 2009
• Volume: 54
• Pages: 1311-1317.
DOI: 10.1021/je800896m
ThermoML:
http://trc.nist.gov/ThermoML/10.1021/je800896m.xml
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Hulse, R. J. J. ].[Ryan J.], Anderson, M. W., Bybee, M. D. D. ].[Michael D.], Gonda, D. D. D. ].[David D.], Miller, C. A. A. ].[Clark A.], Oscarson, J. L.[John L.], Rowley, R. L.[Richard L.], Wilding, W. V.[W. Vincent]
Liquid Thermal Conductivities of Acetonitrile, Diethyl Sulfide, Hexamethyleneimine, Tetrahydrothiophene, and Tetramethylethylenediamine
J. Chem. Eng. Data
• Year: 2004
• Volume: 49
• Pages: 1433-1435.
Keywords:
thermal conductivities, acetonitrile, diethyl sulfide, hexamethyleneimine, tetrahydrothiophene, tetramethylethylenediamine, double-hot-wire apparatus.
DOI: 10.1021/je0498661
ThermoML:
http://trc.nist.gov/journals/jced/2004v49/i05/je0498661.xml
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